SUJANTOKO. The Analysis of Wafe Refraction using SWAN Model. IPTEK The Journal for Technology and Science, [S. l.], v. 20, n. 2, p. 45–56, 2025. DOI: 10.12962/j20882033.v20i2.5887. Disponível em: https://journal.its.ac.id/index.php/jts/article/view/5887. Acesso em: 30 jul. 2026.