Analisis Morfologi Permukaan Lapisan Klorofil dengan Atomic Force Microscopy Lidya Nur De Vega, Suharyana, Budi Purnama

Abstract

Surface morphological characteristic of chlorophyll layer have been analized. Chlorophyll layer deposited by spin coating methods on a glass coated ITO substrates. Results of morphological observation by AFM (Atomic Force Microscopy) explains that a thin layer with N = 5 has a flatter surface than with N = 3 due to inter molecular interaction process. The molecular size of the chlorophyll layers form a Gaussian distribution. From the profile curves, thickness of the layer were obtained as 287,9 and 372,6 nm for N =3 and 5 respectively.